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Accelerating Semiconductor Innovation through Machine Learning-Driven Modeling

by Microwave Product Digest | Jul 3, 2026 | Feature Article

by Keysight Technologies A machine learning-driven extraction workflow has cut BSIM4 MOSFET parameter extraction from more than 100 steps to five or six, validated across 36 device geometries and over 80 simultaneously optimized parameters. A comparable workflow for...

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